Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE7, 21 mm, 10 mm with 0.1 mm spacing
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 10mm long with crosslines at 0.1mm spacing. Surface chrome image.
Size: 21 mm
Divisions: 10 mm with 0.1 mm spacing
Surface: Chrome image
Electron Microscopy Sciences Formvar/Carbon Support Film 25-50 nm/3-4 nm thick on 2X1 mm Slot Grid Copper Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. Coated grids are optically checked followed by batch testing in the electron microscope. Packed in grid storage box. NOTE: All film is laid on the shiny side of the grid. Formvar is 25 to 50 nm thick with a 3 to 4 nm carbon coating.
Grid: Copper
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-MH-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Optical Resolution Grating with Ronchi Ruling 125 lines/ mm
Metallic grating pattern on glass squares with opaque lines approximately 50% of the pitch. Stock items are on 50 mm x 50 mm squares of glass 1.5 mm thick. The glass is B270 with refractive index of 1.52. Mutually perpendicular pairs produce a screen of square apertures. Vacuum deposited chrome gratings on glass substrate. Typically used for testing of resolution, field distortion and parfocal stability, but may be paired to provide interference patterns. 50mm x 50mm B270 glass. 125 lines per mm ruled over 30mm
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SH Hard Bond, 6 µm Particles, 350 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 6 µm
Diameter: 350 mm
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SH Hard Bond, 6 µm Particles, 250 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 6 µm
Diameter: 250 mm
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 1" head with 6 mm Pin, Aluminum, 3.2 mm Pin diameter
SEM specimen mount with shorter pin and slotted head for use with Zeiss/LEO 1500 SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Pin height: 6 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Walton & Beckett Graticule G25, 19 mm,
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. Based on the G22. The G25 is produced by the Institute of Occupational Health.
Size: 19 mm
Electron Microscopy Sciences EMS Gold Aperture with 5 µm hole, 2 mm O.D., 0.53 mm thick
Advanced techniques of thin metal film application permits the apertures to retain a clean hole edge during prolonged beam exposure. Ultra-thin, half-micron design discourages contaminant accumulation and stabilizes astigmatic conditions to provide longer life. Conventional mechanical cleaning involving costly down-time is no longer necessary. Because the foil is ultra thin, care must be taken when handling the gold foil apertures.
Size: 5 µm
O.D.: 2 mm
Thickness: 0.53 mm
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 38 mm head with 6 mm Pin, Aluminum, 1/8" Pin diameter
SEM stub specimen mount with shorter pin (6 mm) and 38 mm slotted head for use with Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 38 mm
Pin height: 6 mm
Pin diameter: 1/8"
Electron Microscopy Sciences PS8 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
Electron Microscopy Sciences Glassine Negative Envelope Plain, 7 x 7 cm
Glassine envelopes, acid free for negative storage. Open end, thumb-cut, side-seamed.
Use: 7 x 7 cm
Electron Microscopy Sciences Cross Lines Graticle NE81, 19 mm, Nominal line width 0.040 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 19 mm
Divisions: Nominal line width 0.040 mm
Surface: Chrome image
Electron Microscopy Sciences Low Magnification SEM Test Specimen Tin On Carbon, JEOL Stub
This low magnification test has a size range of 1 - 10μm for table-top SEM. Has a magnification range of 250-5,000x. Can be used on FESEM and FIB as well.
Type: JEOL Stub